For the first-generation aging equipment of resistive aging loads, the second-generation aging equipment emerged, namely the simple adjustable electronic load. Although its cost is much higher than that of the first-generation products, it can adjust the load current according to the product specifications, overcoming the pain of needing to replace the corresponding resistor when changing the product lines. At the same time, to a certain extent, it has also improved the accuracy and efficiency of aging. The second-generation load overcomes the first three shortcomings of the first-generation load, but the latter four remain prominent and fail to meet the demands of modern production processes. Although there are many standard test electronic load instruments on the market that can fully meet the aging requirements in terms of performance and functions, these instruments are usually expensive, bulky, and mainly designed for testing purposes in research and development, engineering, production, etc., making it difficult to achieve a system networking of hundreds of channels for large-scale aging.
Combining the advantages and disadvantages of the standard electronic load and the previous two generations of aging loads, an optimized design was carried out specifically for the requirements of power supply aging testing. A high-performance MCU (microprocessor) was adopted as the core of the control unit, and an intelligent electronic load module for aging testing and a power supply aging testing system that centrally manages a group of such electronic modules were designed. The aging load belonging to the third generation. Its advantages are as follows:
1. The same module has up to three selectable modes: CC, CV, and LED, and is compatible with multiple products.
2. Within the specification range of the same module, the voltage/current values can be set arbitrarily to precisely match the product specifications.
3. The load mode and parameter Settings are flexible and quick. They can be set globally, or by region or layer.
4. Real-time monitoring of product aging parameters, automatic screening of abnormal products and alarm, and precise location of defective products.
5. It has a wide load setting range, high loading accuracy, and can adapt to various specifications of power supply products.
6. It can record and trace the electrical performance of all tested products, facilitating quality analysis.
7. Centralized computer monitoring and management can effectively supervise the quality of the aging process.
8. It can automatically generate aging reports, facilitating quality analysis and assessment by engineering personnel.
9. The system is easy to operate. One person can manage multiple aging areas, saving labor costs.
10. Modular structure design for convenient system maintenance.
The above-mentioned are all energy-consuming aging electronic loads. There is also an energy feedback aging solution. Compared with the energy-consuming type, the most prominent feature of the energy feedback type is energy conservation and environmental protection, and the benefit it brings to users is electricity bill savings.
However, due to the characteristics of their own solutions and the limitations of current technologies, energy feedback type aging systems usually only have two modes, CC/CV, and the input voltage range is relatively narrow. They are only suitable for the aging of medium and high-power adapters, industrial power supplies, communication power supplies, high-power chargers, and street lamp power supplies, etc.
For the common LED driver power supplies on the market, they cannot be well compatible, mainly due to the following reasons:
Firstly, due to cost constraints, LED driver power supplies are usually simple constant current sources with relatively large output ripple. If the response speed or bandwidth of the load is insufficient, it is very likely to cause oscillation between the power supply and the load. In mild cases, the voltage or current under load may be inaccurate; in severe cases, the product under test may be burned out.
Secondly, the characteristics of the LED driver power supply protection circuit are required to be too high. Aging loads without LED mode generally cannot be loaded normally. For loads without LED mode, if CV mode is used to replace or simulate LED mode, overshoot is very likely to occur at the moment of loading. If the driver power supply protection is too sensitive, it will lead to the inability to load normally. If the protection action is slow, it is easy to drive the power supply of the beaker due to overshoot.
Similarly, if the load bandwidth is insufficient and the response speed is too slow, the power supply is prone to overvoltage protection (OVP). The LED mode of energy-consuming aging loads performs well in these aspects. With the continuous advancement of technology, these problems of energy-fed aging loads will surely be gradually improved and eventually resolved, and aging equipment will definitely develop in the directions of energy conservation, intelligence and automation.
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